MSE 204 – Theory of Electron Microscopy and X-Ray Diffraction

Course Number: MSE 204
Course Units: 3
Instructor: Professor A. Minor

Catalog Description:
 Basic principles of techniques used in the characterization of engineering materials by electron mi8croscopy, diffraction, and spectroscopy; emphasis on detailed analysis of defects responsible for materials properties. Modern electrical, optical and particle beam techniques for the characterization of bulk single crystals and their crystalline and amorphous layers. Examples are Hall effect, Deep Level Transient Spectroscopy, IR-Spectroscopy, Secondary Ion Mass Spectrometry, Rutherford Backscattering Spectrometry, and others. Emphasis on electronic materials especially semiconductors.

 MSE 102, 103 or equivalent.

Course Format: Three hours of lecture per week.