MSE 242 – Advanced Characterization Techniques

Course Number: MSE 242
Course Units: 3

Instructor: Joel Ager

Catalog Description: Advanced electrical, optical, magnetic and ion beam characterization techniques including deep level transient spectroscopy. Photo-luminescence, electron paramagnetic resonance, and Rutherford backscattering, are used to characterize crystalline materials (with emphasis on semi-conductors).

Prerequisites: MSE 204 (can be taken concurrently).

Course format: 2 hours per week of lecture and 3 hours per week of lab