tunneling microscopy is a powerful tool for the study of atomic-scale
properties in solids. Defects can be studied atom by atom; interface
roughness can be studied layer by layer, surface segregation
can be studied atom by atom. For example, the location of individual
dopant atoms can be determined.
"Cross-Sectional Scanning Tunneling Microscopy"
(XSTM) to investigate the geometric and electronic structure
of cleaved semiconductor surfaces. Emphasis is put on the
study of defects (e.g. vacancies, dopants, or dislocations),
quantum-well-structures, super-lattices, and interfaces in
various semiconductor systems. We collaborate closely with
the Salmeron AFM/STM group
of XSTM studies are investigations of defects in GaAs and
of heterostructure interfaces. We also investigated the STM
contrast of the GaAs (110) surface in more detail.
publications of the STM team
Tunneling Microscopy Studies of Si Donors in GaAs"
J.F. Zheng, X. Liu, N. Newman, E.R. Weber, D.F. Ogletree,
and M. Salmeron, Phys. Rev. Lett. 72, 1490 (1994)
Segregation and Clustering in Strained-Layer InGaAs/GaAs Heterostructures
Studied by Cross-Sectional Scanning Tunneling Microscopy"
J.F. Zheng, J.D. Walker, M.B. Salmeron, and E.R. Weber, Phys.
Rev. Lett. 72, 2414 (1994)
resolution studies of dopant effects on intermixing in AlAs/GaAs
short period superlattices"
J.F. Zheng, M. Salmeron and E.R. Weber, Solid State Commun.
93, 419 (1995)
Tunneling Microscopy of Defects in Semiconductors"
N. D. Jäger and E. R. Weber
in Identification of Defects in Semiconductors II; Vol. 51
B , edited by M. Stavola (Academic Press, Boston, 1999), p.
temperature ultrahigh vacuum cross-sectional scanning tunneling
microscope for luminescence measurements"
Yoonho Khang; Yeonjoon Park; Salmeron, M.; Weber, E.R.,
Review of Scientific Instruments, Dec. 1999, vol.70, (no.12):4595-9
of GaAs(110) scanning tunneling microscopy image contrast
by the symmetry of the surface Bloch wave functions"
N. D. Jäger, E. R. Weber, M. Salmeron, Journal of Vacuum
Science & Technology B19, 511 (2001)
Gebauer, last revised 04/07/02