Webergroup
publications
1996-present:
1974-2000:
Selected recent
publications
- Observation
of transition metals at shunt locations in multicrystalline
silicon solar cells
T.
Buonassisi, O.F. Vyvenko, A.A. Istratov, E.R. Weber, G. Hahn,
D. Sontag, J.P. Rakotoniaina, O. Breitenstein, J. Isenberg,
and R. Schindler
J. Appl. Phys. 95, 1556 (2004).online
- Thermal
stability of internal gettering of iron in silicon and its
impact on optimization of gettering
P.
Zhang, H. Vainola, A.A. Istratov, and E.R. Weber
Appl Phys Lett 83, 4324 (2003).online
- Modeling
of competitive gettering of iron in silicon integrated circuit
technology
A.A.
Istratov, W. Huber, E. R. Weber J. Electrochem. Soc. 150,
G244 (2003).online
- Generation-recombination
low-frequency noise signatures in GaAs metalsemiconductor
field-effect transistors on laterally oxidized AlAs
S.
Y. Tzeng, M. J. Cich, R. Zhao, H. Feick, and E. R. Weber
Appl. Phys. Lett. 82, 1063 (2003). online
- Observation
of a hydrogenic donor in the luminescence of electron-irradiated
GaN
Qing Yang, H. Feick, E.R. Weber
Appl. Phys. Lett. 82, 3002 (2003). online
- Contributions
from gallium vacancies and carbon-related defects to the "yellow
luminescence" in GaN
R. Armitage,
William Hong, Qing Yang, H. Feick, J. Gebauer, E. R. Weber,
S. Hautakangas and K. Saarinen
Appl. Phys. Lett. 82, 3457 (2003).online
- Physics
of imaging p-n junctions by scanning tunneling microscopy
and spectroscopy
N. D. Jäger, M. Marso, M. Salmeron, E. R. Weber, K. Urban,
Ph. Ebert
Phys. Rev. B. 67, 165307 (2003). online
- Determination
of the charge carrier compensation mechanism in Te-doped GaAs
by scanning tunneling microscopy
J. Gebauer, E. R. Weber, N. D. Jäger, K. Urban, Ph. Ebert
Appl. Phys. Lett. 82, 2059 (2003). online
- Lattice-matched
HfN buffer layers for epitaxy of GaN on Si
R. Armitage,
Qing Yang, H. Feick, J. Gebauer, E.R. Weber, Satoko Shinkai,
Katsutaka Sasaki
Appl. Phys. Lett. 81, 1450 (2002).
online
- Dopant
atom clustering and charge screening induced roughness of
electronic interfaces in GaAs p-n multilayers
N. D. Jäger, K. Urban, E. R. Weber, and Ph. Ebert
Phys. Rev. B. 65, 235302 (2002). online
- In-situ
diffuse reflectance spectroscopy investigation of low-temperature-grown
GaAs
Ri–an Zhao, Michael J. Cich, Petra Specht, and Eicke
R. Weber
Appl. Phys. Lett. 80, 2060 (2002).online
- X-ray
beam induced current a synchrotron radiation based technique
for the in-situ analysis of recombination properties and chemical
nature of metal clusters in silicon
O.F. Vyvenko, T. Buonassisi, A.A. Istratov, H. Hieslmair,
A.C. Thompson, R. Schindler, and E.R. Weber
J. Appl. Phys. 91, 3614-7 (2002). online
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